On Optical Properties Of Ion Beams Extracted From Electron Cyclotron Resonance Ion Source

摘要

Ion extraction from DECRIS-PM source is simulated by using initialdistributions of ions at the extraction aperture obtained with NAM-ECRIS code.Three-dimensional calculations of plasma emissive surface are done and ions aretraced in the extraction region. The ion beam profiles show strong aberrationsdue to shape of plasma meniscus; hollow beam features are reproduced, as wellas changes in profiles for different focusing conditions.